CHARACTERIZATION OF NANOMATERIAL-BASED CONTACT LENSES BY ATOMIC FORCE MICROSCOPY
In this paper the comparative studies were conducted of the surface areas of nanophotonic contact lens and contact lens made from base material, measured by Nanoprobe Atomic Force Microscope. Nanoprobe atomic force microscopy (AFM) provides information on the size structure on nano scale level, the form of recorded structures (cavities), their distribution of the surface, and the total roughness of the scanned area. The atomic force microscope used in this study is a SPM-5200 of JEOL, Japan. AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. Images of the specimen surface are created by measuring the deflection of the cantilever. The cantilever used in this study is produced by MikroMasch (Estonia) by trade name NCS18/Co-Cr. This AFM probe is silicon etched probe tip that has conical shape. It is coated with Co and Cr layers. Images of surface topography were obtained for each type of contact lenses. The base material of contact lens was made from PMMA and the nanophotonic contact lens was made of fullerene doped PMMA. Fullerenes were used because of their good transitive characteristics in ultraviolet, visible and near infrared light spectrums. Measurements were done at room temperature. Results of topography for both materials are presented and compared.
 M. Tomić, Investigation of the influence of classical and fullerene contact lenses materials on biological fluids by the method of opto-magnetic spectroscopy, M.Sc. thesis, Faculty of Mechanical Engineering, University of Belgrade, Belgrade 2011.
 D. Stamenković, D. Kojić, L.Matija, Z.Miljković, B. Babić, Physical Properties of Contact Lenses Characterized by Scanning Probe Microscopy and OptoMagnetic Fingerprint, International Journal of Modern Physics B, Vol. 24 (6-7) (2010) 825−834.
 Đ. Koruga, S. Hameroff, R. Loutfy, J.Withers, M. Sundereshan, Fullerene C60: History, Physics, Nanobiology, Nanotechnology, Elsevier NorthHolland, Amsterdam,1993.
 L. Matija, Reviewing paper: Nanotechnology: Artificial Versus Natural Self-Assembly, Faculty of Mechanical Engineering, University of Belgrade, FME TRANSACTIONS, Vol. 32−1 (2004) (YU ISSN 1451-2092).
 D. Johnson, N. Hidal, W.R. Bowrn, Basic Principles of Atomic Force Microscopy, Atomic force microscopy in process engineering: An introduction to AFM for improved processes and product, UK, IChemE, 2009.
 JEOL Instruction manual, 2005.